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X-ray Photoelectron Spectroscopy (XPS)

X-ray Photoelectron Spectroscopy (XPS) is a surface-sensitive analytical technique that measures the kinetic energy of electrons emitted from a material when irradiated with X-rays. Because the detected electrons originate from the top 5–10 nm of the surface, XPS provides highly accurate insight into surface chemistry and interfacial composition.

At Materials Metric, XPS is used to determine elemental composition, oxidation states, and chemical bonding environments, as well as to evaluate surface contamination, coatings, and thin films. This capability is essential for understanding how surface chemistry influences adhesion, corrosion resistance, biocompatibility, catalytic activity, and coating performance across polymers, metals, ceramics, and advanced materials.

Use of XPS

XPS is used to:
• Identify elements present on a surface
• Determine oxidation states (e.g., Fe²⁺/Fe³⁺, Ti⁴⁺, etc.)
• Analyze chemical bonding and functional groups
• Evaluate plasma treatments, coatings, or surface modifications
• Detect contamination or thin-film defects
• Characterize corrosion layers and oxides

X-ray photoelectron spectroscopy instrument used for surface chemical analysis
Schematic illustrating XPS photoelectron emission and energy analysis process

Applications of XPS

• Polymers: plasma treatment verification, surface activation
• Metals/Alloys: corrosion, oxide layer composition
• Medical Devices: implant surface chemistry
• Coatings/Thin Films: uniformity, chemical stability
• Electronics: semiconductor and interface analysis
• Catalysts: oxidation states and binding environments

Sample Analysis Process

1. Submission & Review

  • Define elements/chemistries of interest
    • Provide surface history (cleaning, coating, exposure)

2. Sample Preparation

  • Mounting on tabs
    • No coating required
    • Optional sputter cleaning (if appropriate)

3. XPS Measurement

  • Survey scans for elemental composition
    • High-resolution (HR-XPS) scans for chemical states
    • Depth profiling (if requested)

4. Data Processing & Reporting

  • Peak fitting and chemical state interpretation
    • Atomic percent composition
    • Clear discussion of surface chemistry results
XPS spectrum showing counts per second versus binding energy peaks

Why Choose Materials Metric for Your XPS Analysis

Materials Metric provides precise XPS analysis with expert interpretation. Our services include:

  • Chemical state identification for metals, polymers, and coatings
    • Surface contamination detection
    • Oxide layer and corrosion evaluation
    • Quantitative elemental and chemical composition
    • HR-XPS for detailed bonding information
    • Clear reports optimized for R&D and regulatory use

By pairing XPS with XRD, SEM, and ICP, we provide a complete understanding of both surface chemistry and bulk structure.

Related services 

To learn more about our X-ray Photoelectron Spectroscopy (XPS) or other testing needs, please contact us.


Frequently Asked Questions

What is X-ray photoelectron spectroscopy (XPS)?

X-ray photoelectron spectroscopy measures the kinetic energy of electrons emitted when a surface is irradiated with X-rays, giving the elemental composition and chemical states of the top few nanometers. Also called ESCA, it is a quantitative surface-analysis technique. Materials Metric uses XPS for surface chemistry, coatings, and contamination studies.

What can XPS detect or measure?

XPS identifies and quantifies all elements except hydrogen and helium in the outer 5 to 10 nm, and resolves chemical states such as oxide versus metal or different carbon bonding. It supports depth profiling with ion sputtering and mapping of surface composition. Typical detection limits are around 0.1 to 1 atomic percent.

What sample is required for XPS?

Small, vacuum-compatible solid pieces, powders, or films, generally within about a 1 cm size, are suitable, and samples must be clean and free of volatile contamination. Because XPS is ultra-high-vacuum based, outgassing materials need pre-screening. Handling to avoid surface contamination is essential since only the top nanometers are measured.

Which standards apply to XPS?

Materials Metric uses validated or fit-for-purpose methods aligned with ASTM/ISO where applicable, with energy-scale calibration and charge referencing following established surface-analysis practice. Quantification uses documented sensitivity factors and reference materials. The exact protocol is defined to match your surface or depth-profile question.
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